Click
on the picture to transfer to the Society of Manufacturing Engineers
website and read an article about the MIPT.
The scope of the project team is divided into three areas:
1) CAD DATA INTERFACE INCLUDING TOLERANCES AND FEATURES --
Promote vendor support and conduct pilot testing of a standard design
data representation that includes tolerances and features. Link to
the AIAG
CAD Data Flow Group website.
2) INSPECTION PROGRAMMING -- Define DMIS 4.0 application profiles
and conduct pilot testing to achieve inspection programming which
is portable and not system- or tool-dependent. Link to the AIAG
Inspection Programming Group website.
3) COMMON MEASUREMENT DATA FORMAT -- Promote vendor support
and conduct pilot testing of the DML standard for reporting measurement
results. Link to the AIAG
Common Measurement Data Group. Go to the DML
website.
Projects that require testing are being carried out using a distributed
Metrology Testbed that consists of equipment and software owned and
operated by the participants at their own sites. Users, vendors, and
third party organizations concerned about interoperability of dimensional
measurement software and equipment are all invited to participate.

Presentations
NIST presentation
(pps) "Products that support Standards can save you time and
money", from IMTS 2004. This ppt file describes the scope
and overall technical goals of the AIAG-MIPT efforts, and how the
successful results can save users of dimensional metrology systems
time and money.
Presentation at MIPT Panel
Meeting, June 2004. The Automotive Industries Action Group (AIAG)
Metrology Interoperability Project Team (MIPT) held a panel discussion
at the Quality Expo in Novi, Michigan, USA on June 9, 2004. The topic
was Metrology Interoperability and the press announcement describing
the meeting reads as follows: "The Automotive Industries Action
Group, Metrology Interoperability Project Team (AIAG MIPT) has active
participation from many of the key dimensional metrology software,
CMM vendors, and OEMs worldwide. The work of the MIPT is to develop
and enable plug and play within dimensional metrology systems, so
that open, common, and fully functional interfaces exist between all
the subsystems commonly found in dimensional metrology systems. Examples
of the subsystems within the scope of MIPT's efforts include CAD,
CMM controllers, measurement sensors, inspection planning software,
testing & analysis software, programming software, simulation
software, and execution software. This panel will discuss the progress
made toward achieving the goal of metrology interoperability and unveil
future plans." Bob Waite (Daimler Chrysler), Akram Yunas (AIAG),
John Horst (NIST), and Glen Allan (Ford) were the panelists.