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NIST Meeting Results
International Metrology Interoperability Summit 2006
Consortium of Consortia (CoC) meeting
High-level Inspection Process Planning (HIPP) meeting

AIAG
Metrology Interoperability Home
Automotive Industry Action Group

Metrology Interoperability Project Team (MIPT)
MIPT Description and Activities
MIPT Standards Landscape

NIST
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Analysis of Metrology Standards: Presentation
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IMTS 2004
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Quality Expo/Control 2005
Demo Trip Report (pdf)
IDW 2005 Presentation (pps)
IDW Paper (pdf)
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Standards Efforts
Dimensional Markup Language (DML)
Dimensional Metrology Standards Consortium (DMSC)
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Metrology Interoperability Project Team
of the
Automotive Industry Action Group

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Metrology Interoperability Project Team (MIPT) Website
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The AIAG Metrology Interoperability Project Team (AIAG-MIPT)

The goal of the Metrology Interoperability Project Team is to reduce product development cycle time and manufacturing costs by achieving interoperability of the software and hardware components used in automated metrology. The Metrology Interoperability Project Team is organized under the Collaborative Engineering and Process Development Steering Committee of the Automotive Industry Action Group (AIAG). A key mechanism for effecting this is to provide a single "voice of the user" in specifying interoperability requirements. Activities within scope of this group include:

  • Identifying gaps in current standards

  • Performing in-depth evaluation of current and developing standards for a particular interface to determine which to support

  • Identifying and assisting in the harmonization of competing or overlapping standards

  • Developing and performing conformance and interoperability tests

  • Developing specifications for interfaces where no satisfactory non-proprietary standard exists.

  • Developing consensus user requirements to provide as input to standards developing organizations

Metrology  Interoperability Standard - Manufacturing Engineering magazineClick on the picture to transfer to the Society of Manufacturing Engineers website and read an article about the MIPT.
The scope of the project team is divided into three areas:

1) CAD DATA INTERFACE INCLUDING TOLERANCES AND FEATURES -- Promote vendor support and conduct pilot testing of a standard design data representation that includes tolerances and features. Link to the AIAG CAD Data Flow Group website.

2) INSPECTION PROGRAMMING -- Define DMIS 4.0 application profiles and conduct pilot testing to achieve inspection programming which is portable and not system- or tool-dependent. Link to the AIAG Inspection Programming Group website.

3) COMMON MEASUREMENT DATA FORMAT -- Promote vendor support and conduct pilot testing of the DML standard for reporting measurement results. Link to the AIAG Common Measurement Data Group. Go to the DML website.

Projects that require testing are being carried out using a distributed Metrology Testbed that consists of equipment and software owned and operated by the participants at their own sites. Users, vendors, and third party organizations concerned about interoperability of dimensional measurement software and equipment are all invited to participate.


Presentations

NIST presentation (pps) "Products that support Standards can save you time and money", from IMTS 2004. This ppt file describes the scope and overall technical goals of the AIAG-MIPT efforts, and how the successful results can save users of dimensional metrology systems time and money.

Presentation at MIPT Panel Meeting, June 2004. The Automotive Industries Action Group (AIAG) Metrology Interoperability Project Team (MIPT) held a panel discussion at the Quality Expo in Novi, Michigan, USA on June 9, 2004. The topic was Metrology Interoperability and the press announcement describing the meeting reads as follows: "The Automotive Industries Action Group, Metrology Interoperability Project Team (AIAG MIPT) has active participation from many of the key dimensional metrology software, CMM vendors, and OEMs worldwide. The work of the MIPT is to develop and enable plug and play within dimensional metrology systems, so that open, common, and fully functional interfaces exist between all the subsystems commonly found in dimensional metrology systems. Examples of the subsystems within the scope of MIPT's efforts include CAD, CMM controllers, measurement sensors, inspection planning software, testing & analysis software, programming software, simulation software, and execution software. This panel will discuss the progress made toward achieving the goal of metrology interoperability and unveil future plans." Bob Waite (Daimler Chrysler), Akram Yunas (AIAG), John Horst (NIST), and Glen Allan (Ford) were the panelists.


 

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Date Created: November 3, 2004
Last updated: July 25, 2007