Metrology Interoperability Project

Presentations

The Automotive Industries Action Group (AIAG) Metrology Interoperability Project Team (MIPT) held a panel discussion at the Quality Expo in Novi, Michigan, USA on June 9, 2004. The topic was Metrology Interoperability and the press announcement describing the meeting reads as follows: "The Automotive Industries Action Group, Metrology Interoperability Project Team (AIAG MIPT) has active participation from many of the key dimensional metrology software, CMM vendors, and OEMs worldwide. The work of the MIPT is to develop and enable plug and play within dimensional metrology systems, so that open, common, and fully functional interfaces exist between all the subsystems commonly found in dimensional metrology systems. Examples of the subsystems within the scope of MIPT's efforts include CAD, CMM controllers, measurement sensors, inspection planning software, testing & analysis software, programming software, simulation software, and execution software. This panel will discuss the progress made toward achieving the goal of metrology interoperability and unveil future plans." Bob Waite (Daimler Chrysler), Akram Yunas (AIAG), John Horst (NIST), and Glen Allan (Ford) were the panelists. The presentation from that meeting is MetIO QE2004.ppt